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H. von Bardeleben, Jean-Louis Cantin, A. Parisini, A. Bosio, R. Fornari. Conduction mechanism and shallow donor properties in silicon-doped ɛ -G a 2 O 3 thin films: An electron paramagnetic resonance study. Physical Review Materials, 2019, 3 (8), pp.084601. ⟨10.1103/PhysRevMaterials.3.084601⟩. ⟨hal-03924960⟩
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Abdo Hassoun, Shahida Anusha Siddiqui, Slim Smaoui, İ̇lknur Ucak, Rai Naveed Arshad, et al.. Emerging Technological Advances in Improving the Safety of Muscle Foods: Framing in the Context of the Food Revolution 4.0. Food Reviews International, 2022, pp.1-42. ⟨10.1080/87559129.2022.2149776⟩. ⟨hal-04032389⟩
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Bingbing Xia, Jean-Jacques Ganem, Ian Vickridge, Emrick Briand, Sébastien Steydli, et al.. Water-rich conditions during titania atomic layer deposition in the 100 °C-300 °C temperature window produce films with TiIV oxidation state but large H and O content variations. Applied Surface Science, 2022, 601, pp.154233. ⟨10.1016/j.apsusc.2022.154233⟩. ⟨hal-03907172⟩
Dépôts en texte intégral
93
Mots clés
17O
Evaluation
Nanoparticles
7550Pp
13C
Capillary condensation
Passivation
Adsorption Isotherms
GaMnAs
Nickel
Measurement
Alloy
AFM
Gallium oxide
Auger electron spectroscopy AES
ALD
Magnetization curves
Multilayer
Atomic Layer Deposition ALD
Pulsed laser deposition
Pb centers
Silicon
17Op
Epitaxy
Oxidation
Defects
Interface defects
Nitridation
XRD
27Ald p&α
Magnetic semiconductors
7630Lh
Oxygen deficiency
Aluminum
Acoustic
Nuclear reaction analysis
Ageing
SiC
Metal-insulator transition
Adsorption
Rutherford backscattering spectrometry RBS
PIXE
Photoluminescence
Alloys
Thin film
XPS
Adsorbed layers
Magnetic anisotropy
Acoustic propreties of solid
18O
Energy loss
Low energy electron diffraction LEED
Nanostructures
27Aldp
Zinc oxide
Growth
3C-SiC
Charge exchange
Epitaxial growth
Gold
Thin films
Nuclear resonance profiling NRP
Aluminium
X-ray diffraction
Sputtering
Annealing
Ion implantation
8140Ef
EPR
Hysteresis
7550Ee
27Alda
15N
Kossel diffraction
Silica
Isotopic Tracing
Ferromagnetic resonance
HfO2
Diffusion
AC susceptibility
6855Jk
Transparent conductive oxide TCO
Topological defects
Stable isotopic tracing
RBS
Indium oxide
18O resonance
Al2O3
Periodic multilayer
2H
ADSORPTION DESORPTION HYSTERESIS
Ion beam analysis
Silicon Carbide
17Opp
NRP
Topological insulators
Channeling
Silicon carbide
Raman spectroscopy
Density functional theory